Visualization of local deformations in suspended few-layer graphene

An article was recently published in March 2021 by Applied Physics Letters titled: “Direct visualization of local deformations in suspended few-layer graphene membranes by coupled in situ atomic force and scanning electron microscopy”.

Silson membranes with holes were used to analyse graphene using a coupled in-situ AFM-SEM system, the paper reads: “As a model 2D membrane, we use mechanically exfoliated few-layer graphene flakes (5 layers) transferred onto holey silicon carrier chips with single central holes (custom made from Silson Ltd., UK)”

Here is the link to the full paper!

Case studies