Investigating the secondary electron emission of nanomaterials induced by a high resolution proton beam

Cholewa et Al recently published their research which investigates “the Secondary Electron Emission (SEE) from 1-dimensional (1D) nanomaterials in the form of nanorods”. The work undertaken aimed to find materials with the highest achievable SEE emission – a key part of the development and application of novel radiation detectors.

For the sample preparation, ZnO and ZnO/GaN samples were grown on Silson’s 1μm thick Si3N4 membranes. Samples were studied by scanning electron microscopy (SEM) to gain insight into their surface morphology.

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