Raman scattering enhancement of dielectric microspheres on silicon nitride film

Scientific reports have published a paper by Ogura which reports Raman scattering enhancement in dielectric microspheres on a silicon nitride (SiN) film. This research is both fascinating and important as it might lead to the development of high-sensitive sensors and optical devices.

For the sample preparation, the microsphere suspension was placed on one of Silson’s 4x4mm^2 membranes with a 381μm thick frame.

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Case studies

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