Microscopy and Microanalysis have published an article by Ogura et Al about a recently developed “scanning electron-assisted dielectric microscope (SE-ADM), based on scanning electron microscope, which enables the observation of various specimens in solution” – these observations are usually not possible due to vacuum conditions inside the sample chamber.
The abstract reads: “in this study, we developed a general-purpose dielectric constant imaging unit attached to commercially available SEMs. The new SE-ADM unit can be directly attached to the standard stage of an SEM, and the dielectric signal detected from this unit can be input to the external input terminal of the SEM, enabling simultaneous observation yielding SEM and SE-ADM images.”
Silson’s silicon nitride membranes of membrane size 0.1 x 0.1 mm and thickness 10 nm were used in the sample holder in the observation of aggregated PM2.5, Another of Silson’s silicon nitride membranes was also used on the lower surface of the holder (membrane size 0.2 x 0.2 mm and thickness 20 nm).
To read more about the research and the SE-ADM, follow this link!
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