Exploring the Preparation Dependence of Crystalline 2D-Extended Ultrathin C8-BTBT-C8 Films

An article recently published by ACS Applied Materials and Interfaces uses atomic force microscopy and X-ray spectromicroscopy to “illustrate the influence of the underlying growth mechanism and determine the highly preparation-dependent orientation of the thiophene backbone” of thin films from the C8-BTBT-C8 molecule.

Silson’s 100nm thick membranes were used for Scanning Transmission X-ray Microscopy measurements.

Here is the link to read more on this article about C8-BTBT-C8 films!

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