Observing High-Cycle Fatigue Damage in Freestanding Gold Thin Films with Bulge Testing and Intermittent TEM Imaging

Advanced Engineering Materials has published an article by Krapf et Al about their research of a “new experimental workflow combining standalone bulge cyclic testing with intermittent high-resolution imaging by transmission electron microscopy (TEM) at specific positions of interest”, with a view to combating the fact that bulge testing is only possible in limited experimental configurations.

The abstract concludes “the presented setup can be used with a number of TEM-based characterization techniques and has the potential to reveal cyclic deformation mechanisms in several thin film systems”.

Silson’s silicon nitride membranes of frame size 12.5 x 12.5 mm and thickness 525μm and membrane size 1 x 4 mm and thickness 100 nm were used to fabricate the freestanding gold thin films used for this study.

Follow this link to read the full paper!

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