Microplastics and Nanoplastics has published an article by Foetisch et Al which uses “scanning transmission x-ray micro spectroscopy to characterize depth profiles of the surface alteration of environmental plastic debris retrieved from soil samples”. It is important to characterize the transformation of macro- (MaP), micro- (MP) and nanoplastics (NP) in “soils to better predict their impact and interactions in this environment”.
Silson’s silicon nitride membranes were used for the sample preparation for STXM, which were performed at the PolLux beamline of the Swiss Light Source (SLS) synchrotron at the Paul Scherrer Institute. Silson’s membranes had a membrane size of 1 mm and thickness 100 nm, in a 5 mm (200um thick) frame.
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