Applicability of focused Ion beam milling to the fracture toughness characterization of gold thin films

Silson’s membranes were used in a recent article published by the Journal of Materials Research, titled the ‘Applicability of focused Ion Beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films’, which demonstrated that ion species and milling parameters do not affect fracture toughness measurements on freestanding gold thin films.

The article reads: ‘The gold thin film specimens were produced by physical vapor deposition onto a 4 by 1 mm sacrificial SiNx carrier membrane (Silson Ltd, UK), using a custom-built thermal evaporation unit’.  Click here to read the full article!

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